Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/10068
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dc.contributor.authorAbella, Jaume-
dc.contributor.authorVera, Xavier-
dc.contributor.authorÜnsal, Osman S.-
dc.contributor.authorErgin, Oğuz-
dc.contributor.authorGonzalez, Antonio-
dc.contributor.authorTschanz, James W.-
dc.contributor.authorKartal, Yavuz Selim-
dc.date.accessioned2023-01-09T11:49:01Z-
dc.date.available2023-01-09T11:49:01Z-
dc.date.issued2008-
dc.identifier.issn0272-1732-
dc.identifier.issn1937-4143-
dc.identifier.urihttps://doi.org/10.1109/MM.2008.92-
dc.identifier.urihttps://hdl.handle.net/20.500.11851/10068-
dc.description.abstractElectromigration is a major source of wire and via failure. Refueling undoes em for bidirectional wires and power/ground grids-some of a chip's most vulnerable wires. Refueling exploits em's self-healing effect by balancing the amount of current flowing in both directions of a wire. It can significantly extend a wire's lifetime while reducing the chip area devoted to wires.en_US
dc.description.sponsorshipGerman Federal Ministry of Education and Research (BMBF) [01FP20031J]en_US
dc.language.isoenen_US
dc.publisherIEEE MICROen_US
dc.relation.ispartofExperimental Ir Meets Multilinguality, Multimodality, and Interaction (Clef 2022)en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectFAILUREen_US
dc.titleRefueling: Preventing wire degradation due to electromigrationen_US
dc.typeArticleen_US
dc.departmentESTÜen_US
dc.identifier.volume28en_US
dc.identifier.issue6en_US
dc.identifier.startpage37en_US
dc.identifier.endpage46en_US
dc.identifier.wosWOS:000261998900005-
dc.institutionauthorErgin, Oğuz-
dc.identifier.doi10.1109/MM.2008.92-
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.scopusqualityQ1-
dc.identifier.wosqualityQ2-
item.openairetypeArticle-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.languageiso639-1en-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
crisitem.author.dept02.3. Department of Computer Engineering-
Appears in Collections:Bilgisayar Mühendisliği Bölümü / Department of Computer Engineering
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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