Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/11999
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dc.contributor.authorKucukyilmaz, Emre-
dc.contributor.authorTekci, Nazif Orhun-
dc.contributor.authorRazmkhah, Sasan-
dc.contributor.authorBozbey, Ali-
dc.date.accessioned2025-01-10T21:00:43Z-
dc.date.available2025-01-10T21:00:43Z-
dc.date.issued2024-
dc.identifier.issn1300-0632-
dc.identifier.issn1303-6203-
dc.identifier.urihttps://doi.org/10.55730/1300-0632.4101-
dc.identifier.urihttps://hdl.handle.net/20.500.11851/11999-
dc.descriptionTekci, Nazif Orhun/0009-0004-6228-1271en_US
dc.description.abstractCryogenic circuits, such as those based on single flux quantum (SFQ) logic, function at extremely low temperatures. Therefore, the designs target the utilization of liquid helium (LHe) temperatures, maintaining them at 4.2 K. These specialized circuits can be subjected to measurement either within liquid helium (LHe) baths or enclosed within closed-cycle cryocoolers. However, when utilizing LHe in cryocooler systems, inherent weak thermal contact can lead to temperature gradients between the circuit chip and the cold head, where conventional temperature sensors are typically placed. To address this challenge, this study introduces an innovative on-chip temperature sensing approach that capitalizes on the temperature dependence of the Josephson junction's (JJ) critical current (IC ). The relationship between JJ's I C and temperature (IC vs. T) is meticulously derived and calibrated within the cryocooler system. Subsequently, this I C vs. T profile is mathematically fitted to a polynomial function and integrated into an embedded microcontroller. This microcontroller facilitates the supply and measurement of bias currents and voltages, effectively establishing an autonomous temperature monitoring system. Implementing this sensor mitigates temperature disparities on the chip's surface compared to the intended target temperature and eradicates measurement errors that might arise due to such discrepancies.en_US
dc.language.isoenen_US
dc.publisherTubitak Scientific & Technological Research Council Turkeyen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectCryogenic Electronicsen_US
dc.subjectTemperature Measurementen_US
dc.subjectJosephson Junctionsen_US
dc.subjectSuperconductor Integrated Circuitsen_US
dc.titleIn-Situ Superconductor Temperature Sensor for Cryogenic Integrated Circuitsen_US
dc.typeArticleen_US
dc.departmentTOBB University of Economics and Technologyen_US
dc.identifier.volume32en_US
dc.identifier.issue6en_US
dc.authoridTekci, Nazif Orhun/0009-0004-6228-1271-
dc.identifier.wosWOS:001363440000002-
dc.identifier.scopus2-s2.0-85210967467-
dc.identifier.doi10.55730/1300-0632.4101-
dc.authorscopusid59456120200-
dc.authorscopusid59456364200-
dc.authorscopusid26538855100-
dc.authorscopusid13606998800-
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.scopusqualityQ3-
dc.identifier.trdizinid1283768-
dc.identifier.wosqualityQ4-
dc.description.woscitationindexScience Citation Index Expanded-
item.grantfulltextnone-
item.fulltextNo Fulltext-
item.openairetypeArticle-
item.cerifentitytypePublications-
item.languageiso639-1en-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
crisitem.author.dept02.5. Department of Electrical and Electronics Engineering-
crisitem.author.dept02.5. Department of Electrical and Electronics Engineering-
Appears in Collections:Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
TR Dizin İndeksli Yayınlar / TR Dizin Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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