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https://hdl.handle.net/20.500.11851/12204| Title: | Electrical characterization of ALD grown HfO2 memristive devices and their noise analysis | Authors: | Köymen, Itır Bozat, Özgür Öztoprak, İlker Gökçe, Aisha Chan, (Sam) Yun Fu Brown, Gavin Douglas, Robert |
Publisher: | Koç University | Abstract: | [No Abstract Available] | Description: | NanoTR-18 18th Nanoscience And Nanotechnology Conference 26-28 August 2024, Koç University, İstanbul - Türkiye | URI: | https://drive.google.com/file/d/1gM7puknncJxsP4pLWs8qCOJUTpEX-iNf/view?usp=sharing https://hdl.handle.net/20.500.11851/12204 |
| Appears in Collections: | Elektrik ve Elektronik Mühendisliği Bölümü / Department of Electrical & Electronics Engineering |
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