Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/1980
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dc.contributor.authorEker, Abulaziz-
dc.contributor.authorErgin, Oğuz-
dc.date.accessioned2019-07-10T14:42:43Z
dc.date.available2019-07-10T14:42:43Z
dc.date.issued2015
dc.identifier.citationEker, A., & Ergin, O. (2015, October). Using value similarity of registers for soft error mitigation. In 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) (pp. 91-96). IEEE.en_US
dc.identifier.isbn978-1-5090-0312-9
dc.identifier.issn1550-5774
dc.identifier.urihttps://ieeexplore.ieee.org/document/7315142-
dc.identifier.urihttps://hdl.handle.net/20.500.11851/1980-
dc.descriptionIEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) (2015 : Univ Massachusetts Amherst, Amherst, MA)
dc.description.abstractSoft errors caused by the cosmic particles or the radiation from the packaging material of the integrated circuits are an increasingly important design problem. With the shrinking feature sizes, the datapath components of the out-of-order superscalar pipeline are becoming more prone to soft errors. Being the major data holding component in contemporary microprocessors, the register file has been an important part of the processor on which researchers offered many different schemes to protect against soft errors. We start with the observation that many of the stored values inside the register file have very small Hamming distances when compared to each other. After showing this analysis results we propose a soft error correction scheme that makes use of the presence of multiple register values that have zero Hamming distance from each other. We use this already available redundancy along with parity protection to achieve error correction for many of the stored values. Our results show that, by employing schemes that make use of the already available copies of the values inside the register file, it is possible to detect and correct 39.0% of the errors with an additional power consumption of 18.9%.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.relation.ispartofIEEE International Symposium on Defect and Fault Tolerance in VLSI Systemsen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectmicroprocessor architectureen_US
dc.subjectregister fileen_US
dc.subjectsoft erroren_US
dc.titleUsing Value Similarity of Registers for Soft Error Mitigationen_US
dc.typeConference Objecten_US
dc.departmentFaculties, Faculty of Engineering, Department of Computer Engineeringen_US
dc.departmentFakülteler, Mühendislik Fakültesi, Bilgisayar Mühendisliği Bölümütr_TR
dc.identifier.startpage91
dc.identifier.endpage96
dc.authorid0000-0003-2701-3787-
dc.identifier.wosWOS:000380437100017en_US
dc.identifier.scopus2-s2.0-84962909406en_US
dc.institutionauthorErgin, Oğuz-
dc.identifier.doi10.1109/DFT.2015.7315142-
dc.authorwosidE-5717-2010-
dc.authorscopusid6603141208-
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.identifier.scopusquality--
item.languageiso639-1en-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
item.openairetypeConference Object-
item.cerifentitytypePublications-
crisitem.author.dept02.3. Department of Computer Engineering-
Appears in Collections:Bilgisayar Mühendisliği Bölümü / Department of Computer Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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