Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/4061
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dc.contributor.authorKöymen, H.-
dc.contributor.authorAhıska, Y.-
dc.contributor.authorAtalar, A.-
dc.contributor.authorKöymen, Itır-
dc.contributor.authorTaşdelen, A. S.-
dc.contributor.authorYılmaz, M.-
dc.date.accessioned2021-01-25T11:32:58Z-
dc.date.available2021-01-25T11:32:58Z-
dc.date.issued2020-09
dc.identifier.citationKoymen, H., Ahiska, Y., Atalar, A., Köymen, I., Tasdelen, A. S., and Yilmaz, M. (2020, September). Mic-in-CMOS: CMUT as a Sealed-Gap Capacitive Microphone. In 2020 IEEE International Ultrasonics Symposium (IUS) (pp. 1-4). IEEE.en_US
dc.identifier.isbn978-172815448-0
dc.identifier.issn19485719
dc.identifier.urihttps://hdl.handle.net/20.500.11851/4061-
dc.identifier.urihttps://ieeexplore.ieee.org/document/9251557-
dc.description.abstractThe design and production of a CMOS compatible, watertight and ingress-proof CMUT (capacitive micromachined ultrasonic transducer) microphone, mic-in-CMOS, with vacuum-gap is described. We present an analytical model-based approach for the design of mic-in-CMOS, where a basis for quantitative comparison of performance trade-offs is provided. The sealed vacuum gap of the mic-in-CMOS is basically a lossless sensor, free of mechanical noise. Its SNR is determined by the noise of the pre-amplification electronics (the noise contributor in a CMUT with vacuum gap is essentially the radiation resistance, which is less than 0 dBA for audio band for a 1 mm2 device). The design of mic-in-CMOS involves many multilateral trade-offs such as gap height vs membrane thickness vs sensitivity vs need for linear operation vs bias voltage and atmospheric depression, to name few. The mic-in-CMOS design can be mass produced using CMOS film stacks only, as such the fabrication process can be carried out entirely in a CMOS processes production line complemented with CMOS compatible post-processing approaches. Mic-in-CMOS has the advantage of low production cost with minimal packaging requirement and on-die EMI / EMC. © 2020 IEEE.en_US
dc.language.isoenen_US
dc.publisherIEEE Computer Societyen_US
dc.relation.ispartof2020 IEEE International Ultrasonics Symposium (IUS)en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectCapacitive microphoneen_US
dc.subjectCMOSen_US
dc.subjectCMUTen_US
dc.subjectMEMSen_US
dc.subjectSealed gapen_US
dc.titleMic-In Cmut as a Sealed-Gap Capacitive Microphoneen_US
dc.typeConference Objecten_US
dc.departmentFaculties, Faculty of Engineering, Department of Electrical and Electronics Engineeringen_US
dc.departmentFakülteler, Mühendislik Fakültesi, Elektrik ve Elektronik Mühendisliği Bölümütr_TR
dc.authorid0000-0002-7233-2704-
dc.identifier.wosWOS:000635688900253en_US
dc.identifier.scopus2-s2.0-85097894617en_US
dc.institutionauthorKöymen, Itır-
dc.identifier.doi10.1109/IUS46767.2020.9251557-
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.identifier.scopusquality--
item.openairetypeConference Object-
item.languageiso639-1en-
item.grantfulltextnone-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
crisitem.author.dept02.5. Department of Electrical and Electronics Engineering-
Appears in Collections:Elektrik ve Elektronik Mühendisliği Bölümü / Department of Electrical & Electronics Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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