Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/5750
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dc.contributor.authorAbella J.-
dc.contributor.authorvera X.-
dc.contributor.authorÜnsal O.-
dc.contributor.authorErgin, Oğuz-
dc.contributor.authorGonzález A.-
dc.date.accessioned2021-09-11T15:19:53Z-
dc.date.available2021-09-11T15:19:53Z-
dc.date.issued2007en_US
dc.identifier.citationIOLTS 2007 13th IEEE International On-Line Testing Symposium, 8 July 2007 through 11 July 2007, Heraklion, Crete, 72540en_US
dc.identifier.isbn0769529186; 9780769529189-
dc.identifier.urihttps://doi.org/10.1109/IOLTS.2007.34-
dc.identifier.urihttps://hdl.handle.net/20.500.11851/5750-
dc.description.abstractThis paper proposes the fuse, a technique to anticipate failures due to degradation in any ALU (Arithmetic Logic Unit), and particularly in an adder. The fuse consists of a replica of the weakest transistor in the adder and the circuitry required to measure its degradation. By mimicking the behavior of the replicated transistor the fuse anticipates the failure short before the first failure in the adder appears, and hence, data corruption and program crashes can be avoided. Our results show that the fuse anticipates the failure in more than 99.9% of the cases after 96.6% of the lifetime, even for pessimistic random within-die variations. © 2007 IEEE.en_US
dc.description.sponsorshipIEEE Computer Society;Test Technology Technical Council (TTTC)en_US
dc.language.isoenen_US
dc.relation.ispartofProceedings - IOLTS 2007 13th IEEE International On-Line Testing Symposiumen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.titleFuse: a Technique To Anticipate Failures Due To Degradation in Alusen_US
dc.typeConference Objecten_US
dc.departmentFaculties, Faculty of Engineering, Department of Computer Engineeringen_US
dc.departmentFakülteler, Mühendislik Fakültesi, Bilgisayar Mühendisliği Bölümütr_TR
dc.identifier.startpage15en_US
dc.identifier.endpage22en_US
dc.identifier.scopus2-s2.0-46749083847en_US
dc.institutionauthorErgin, Oğuz-
dc.identifier.doi10.1109/IOLTS.2007.34-
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.relation.conferenceIOLTS 2007 13th IEEE International On-Line Testing Symposiumen_US
item.openairetypeConference Object-
item.languageiso639-1en-
item.grantfulltextnone-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
crisitem.author.dept02.3. Department of Computer Engineering-
Appears in Collections:Bilgisayar Mühendisliği Bölümü / Department of Computer Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
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