Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/6646
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dc.contributor.authorKarslı, I. Burak-
dc.contributor.authorReviriego, Pedro-
dc.contributor.authorBalli, M. Fatih-
dc.contributor.authorErgin, Oğuz-
dc.contributor.authorMaestro, J. A.-
dc.date.accessioned2021-09-11T15:43:03Z-
dc.date.available2021-09-11T15:43:03Z-
dc.date.issued2013en_US
dc.identifier.issn1556-6056-
dc.identifier.issn1556-6064-
dc.identifier.urihttps://doi.org/10.1109/L-CA.2012.6-
dc.identifier.urihttps://hdl.handle.net/20.500.11851/6646-
dc.description.abstractSoft errors are transient errors that can alter the logic value of a register bit causing data corruption. They can be caused by radiation particles such as neutrons or alpha particles. Narrow values are commonly found in the data consumed or produced by processors. Several techniques have recently been proposed to exploit the unused bits in narrow values to protect them against soft errors. These techniques replicate the narrow value over the unused register bits such that errors can be detected when the value is duplicated and corrected when the value is tripled. In this letter, a technique that can correct errors when the narrow value is only duplicated is presented. The proposed approach stores a modified duplicate of the narrow value such that errors on the original value and the duplicate can be distinguished and therefore corrected. The scheme has been implemented at the circuit level to evaluate its speed and also at the architectural level to assess the benefits in correcting soft errors. The results show that the scheme is significantly faster than a parity check and can improve substantially the number of soft errors that are corrected compared to existing techniques.en_US
dc.description.sponsorshipSpanish Ministry of Science and EducationSpanish Government [AYA2009-13300-C03]; Scientific and Technological Research Council of Turkey (TUBITAK)Turkiye Bilimsel ve Teknolojik Arastirma Kurumu (TUBITAK) [112E004]en_US
dc.description.sponsorshipThis work was supported in part by the Spanish Ministry of Science and Education under Grant AYA2009-13300-C03 and by the Scientific and Technological Research Council of Turkey (TUBITAK) under Grant 112E004. The work is a collaboration in the framework of COST ICT Action 1103 "Manufacturable and Dependable Multicore Architectures at Nanoscale".en_US
dc.language.isoenen_US
dc.publisherIEEE Computer Socen_US
dc.relation.ispartofIEEE Computer Architecture Lettersen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectError Correctionen_US
dc.subjectSoft Errorsen_US
dc.subjectNarrow Valuesen_US
dc.subjectData Cacheen_US
dc.titleEnhanced Duplication: a Technique To Correct Soft Errors in Narrow Valuesen_US
dc.typeArticleen_US
dc.departmentFaculties, Faculty of Engineering, Department of Computer Engineeringen_US
dc.departmentFakülteler, Mühendislik Fakültesi, Bilgisayar Mühendisliği Bölümütr_TR
dc.identifier.volume12en_US
dc.identifier.issue1en_US
dc.identifier.startpage13en_US
dc.identifier.endpage16en_US
dc.authorid0000-0002-8066-221X-
dc.authorid0000-0003-2540-5234-
dc.authorid0000-0003-2701-3787-
dc.authorid0000-0001-6805-6519-
dc.authorid0000-0001-7133-9026-
dc.identifier.wosWOS:000320993000005en_US
dc.identifier.scopus2-s2.0-84879047255en_US
dc.institutionauthorErgin, Oğuz-
dc.identifier.doi10.1109/L-CA.2012.6-
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.scopusqualityQ2-
item.openairetypeArticle-
item.languageiso639-1en-
item.grantfulltextnone-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
crisitem.author.dept02.3. Department of Computer Engineering-
Appears in Collections:Bilgisayar Mühendisliği Bölümü / Department of Computer Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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