Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/7379
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dc.contributor.authorErgin, Oğuz-
dc.contributor.authorÜnsal, Osman S.-
dc.contributor.authorvera, Xavier-
dc.contributor.authorGonzalez, Antonio-
dc.date.accessioned2021-09-11T15:56:42Z-
dc.date.available2021-09-11T15:56:42Z-
dc.date.issued2009en_US
dc.identifier.issn1545-5971-
dc.identifier.issn1941-0018-
dc.identifier.urihttps://doi.org/10.1109/TDSC.2008.18-
dc.identifier.urihttps://hdl.handle.net/20.500.11851/7379-
dc.description.abstractSoft errors are an important challenge in contemporary microprocessors. Particle hits on the components of a processor are expected to create an increasing number of transient errors with each new microprocessor generation. In this paper, we propose simple mechanisms that effectively reduce the vulnerability to soft errors in a processor. Our designs are generally motivated by the fact that many of the produced and consumed values in the processors are narrow and their upper order bits are meaningless. Soft errors caused by any particle strike to these higher order bits can be avoided by simply identifying these narrow values. Alternatively, soft errors can be detected or corrected on the narrow values by replicating the vulnerable portion of the value inside the storage space provided for the upper order bits of these operands. As a faster but less fault tolerant alternative to ECC and parity, we offer a variety of schemes that make use of narrow values and analyze their efficiency in reducing soft error vulnerability of different data-holding components of a processor. On average, techniques that make use of the narrowness of the values can provide 49 percent error detection, 45 percent error correction, or 27 percent error avoidance coverage for single bit upsets in the first level data cache across all Spec2K. In other structures such as the immediate field of the issue queue, an average error detection rate of 64 percent is achieved.en_US
dc.description.sponsorshipIntel Barcelona Research Centeren_US
dc.description.sponsorshipThis work was done while Oguz Ergin and Osman Unsal were with the Intel Barcelona Research Center.en_US
dc.language.isoenen_US
dc.publisherIEEE Computer Socen_US
dc.relation.ispartofIEEE Transactions On Dependable And Secure Computingen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectMemory structures-reliabilityen_US
dc.subjecttesting and fault toleranceen_US
dc.subjectsoft errorsen_US
dc.subjectnarrow valuesen_US
dc.titleReducing Soft Errors Through Operand Width Aware Policiesen_US
dc.typeArticleen_US
dc.departmentFaculties, Faculty of Engineering, Department of Computer Engineeringen_US
dc.departmentFakülteler, Mühendislik Fakültesi, Bilgisayar Mühendisliği Bölümütr_TR
dc.identifier.volume6en_US
dc.identifier.issue3en_US
dc.identifier.startpage217en_US
dc.identifier.endpage230en_US
dc.authorid0000-0002-0544-9697-
dc.authorid0000-0002-0009-0996-
dc.authorid0000-0003-2701-3787-
dc.identifier.wosWOS:000268590700005en_US
dc.identifier.scopus2-s2.0-69249215399en_US
dc.institutionauthorErgin, Oğuz-
dc.identifier.doi10.1109/TDSC.2008.18-
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
item.openairetypeArticle-
item.languageiso639-1en-
item.grantfulltextnone-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
crisitem.author.dept02.3. Department of Computer Engineering-
Appears in Collections:Bilgisayar Mühendisliği Bölümü / Department of Computer Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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