Please use this identifier to cite or link to this item:
Title: High performance adjacent error detection for nanometer devices
Authors: Erozan, A. T.
Tavlı, Bülent
Keywords: Error detection codes
error correction codes
SRAM chips
radiation hardening (electronics)
CMOS memory circuits
parity check codes
high performance adjacent error detection
nanometer devices
static random-access memory
electronic systems
radiation induced soft errors
radiation effects
error correction codes
soft error mitigation
radiation particle
CMOS process technology
Euclidean geometry-low density parity check code
adjacent error detection performance
Issue Date: 13-Oct-2016
Publisher: Inst Engineering Technology-Iet
Source: Erozan, A. T., & Tavli, B. (2016). High performance adjacent error detection for nanometer devices. Electronics Letters, 52(21), 1788-1789.
Abstract: Static random-access memory (SRAM) based memories are widely used in electronic systems and if their contents change due to external reasons, the electronic system can functionally fail. One of the external reasons is the radiation induced soft errors as the SRAM memories are susceptible to radiation effects. Majority of the recently proposed methods use error correction codes (ECC) to mitigate soft errors. Error correction/detection capabilities of such methods are at most 3 bits in a codeword which will be insufficient while number of memory bits affected by a radiation particle is increased, as CMOS process technology shrinks towards around 5 nm. Since memory bits affected by a radiation particle are physically close, adjacent error detection/correction becomes a hot research topic. In this Letter, Euclidean geometry-low density parity check code, more capable ECC than Hamming code used in recent works, is explored in context of adjacent error detection performance. The results show that proposed method successfully detects up to 14-bit adjacent errors in a 15-bit codeword. As such, this method is suitable where high detection performance is needed. The proposed method is also simplified for efficient hardware implementation while detection performance is not sacrificed. Both methods are compared in terms of resource usage.
ISSN: 0013-5194
Appears in Collections:Elektrik ve Elektronik Mühendisliği Bölümü / Department of Electrical & Electronics Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

Show full item record

CORE Recommender


checked on Sep 23, 2022


checked on Sep 24, 2022

Page view(s)

checked on Feb 6, 2023

Google ScholarTM



Items in GCRIS Repository are protected by copyright, with all rights reserved, unless otherwise indicated.