Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/1356
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dc.contributor.authorMahariq, İbrahim-
dc.contributor.authorKuzuoğlu, M.-
dc.contributor.author Tarman, I. H.-
dc.contributor.authorKurt, Hamza-
dc.date.accessioned2019-06-26T07:43:38Z
dc.date.available2019-06-26T07:43:38Z
dc.date.issued2014-09
dc.identifier.citationMahariq, I., Kuzuoğlu, M., Tarman, I. H., & Kurt, H. (2014). Photonic nanojet analysis by spectral element method. IEEE Photonics Journal, 6(5), 1-14.en_US
dc.identifier.issn19430655
dc.identifier.urihttps://ieeexplore.ieee.org/document/6916995?arnumber=6916995&tag=1-
dc.identifier.urihttps://hdl.handle.net/20.500.11851/1356-
dc.description.abstractAlthough it is known that the spectral element method (SEM) has both high accuracy and a lower computational cost when compared with finite-element or finite-difference methods, the SEM is not widely utilized in the modeling of boundary value problems in electromagnetics. This paper provides a 2-D formulation of the well-known perfectly-matched-layer approach in the context of the SEM for the frequency-domain electromagnetic problems in which dielectric scatterers are involved. The formulation is then utilized to numerically study photonic nanojets after the demonstration of SEM accuracy in an electromagnetic scattering problem. Interesting cases where unusual results are obtained from scattering dielectric cylinders are reported and discussed in this paper. On the other hand, a finite-difference time-domain method that is widely deployed for investigating photonic nanojets is found to fail in successfully capturing such resonance cases. Sharp resonances are characteristic of high-Q cavities and numerical methods with high accuracy, e.g., the SEM can provide superior performance while exploring such resonators. © 2009-2012 IEEE.en_US
dc.language.isoenen_US
dc.publisherInstitute Of Electrical And Electronics Engineers Inc.en_US
dc.relation.ispartofIEEE Photonics Journalen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectMicrospheresen_US
dc.subjectphotonicsen_US
dc.subjectphotonic jeten_US
dc.titlePhotonic Nanojet Analysis by Spectral Element Methoden_US
dc.typeArticleen_US
dc.rights.holder© 20XX IEEE.  Personal use of this material is permitted.  Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
dc.departmentFaculties, Faculty of Engineering, Department of Electrical and Electronics Engineeringen_US
dc.departmentFakülteler, Mühendislik Fakültesi, Elektrik ve Elektronik Mühendisliği Bölümütr_TR
dc.identifier.volume6
dc.identifier.issue5
dc.authorid0000-0002-0749-4205-
dc.identifier.wosWOS:000343048500028en_US
dc.identifier.scopus2-s2.0-84940772109en_US
dc.institutionauthorKurt, Hamza-
dc.identifier.doi10.1109/JPHOT.2014.2361615-
dc.authorscopusid57189350201-
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.scopusqualityQ1-
item.fulltextWith Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.languageiso639-1en-
item.cerifentitytypePublications-
item.openairetypeArticle-
item.grantfulltextopen-
crisitem.author.dept02.5. Department of Electrical and Electronics Engineering-
Appears in Collections:Elektrik ve Elektronik Mühendisliği Bölümü / Department of Electrical & Electronics Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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