Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/1982
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dc.contributor.authorYalçın, Gülay-
dc.contributor.authorİşlek, Emrah-
dc.contributor.authorTozu, Öykü-
dc.contributor.authorReviriego, Pedro-
dc.contributor.authorCristal, Adrian-
dc.contributor.authorÜnsal, Osman Sabri-
dc.contributor.authorErgin, Oğuz-
dc.date.accessioned2019-07-10T14:42:43Z
dc.date.available2019-07-10T14:42:43Z
dc.date.issued2014
dc.identifier.citationYalcin, G., Islek, E., Tozlu, O., Reviriego, P., Cristal, A., Unsal, O. S., & Ergin, O. (2014, July). Exploiting a fast and simple ECC for scaling supply voltage in level-1 caches. In 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) (pp. 1-6). IEEE.en_US
dc.identifier.isbn978-1-4799-5324-0
dc.identifier.issn1942-9398
dc.identifier.urihttps://ieeexplore.ieee.org/document/6873660-
dc.identifier.urihttps://hdl.handle.net/20.500.11851/1982-
dc.descriptionIEEE 20th International On-Line Testing Symposium (IOLTS) (2014 : Catalunya, SPAIN)
dc.description.abstractScaling supply voltage to near-threshold is a very effective approach in reducing the energy consumption of computer systems. However, executing below the safe operation margin of supply voltage introduces high number of persistent failures, especially in memory structures. Thus, it is essential to provide reliability schemes to tolerate these persistent failures in the memory structures. In this study, we adopt a Single Error Correction Multiple Adjacent Error Correction (SEC-MAEC) code in order to minimize the energy consumption of L1 caches. In our evaluations, we present that the SEC-MAEC code is a fast and energy efficient Error Correcting Code (ECC). It presents 10X less area overhead and 2X less latency for the decoder compared to Orthogonal Latin Square Code, the state-of-the art ECC utilized in the L1 cache under the scaling supply voltage.en_US
dc.description.sponsorshipCollaboration in the framework of COST ICT [1103]
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.relation.ispartofIEEE International On-Line Testing Symposiumen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectError correctionen_US
dc.subjectRadiation hardeningen_US
dc.subjectCorrection codesen_US
dc.titleExploiting a Fast and Simple ECC for Scaling Supply Voltage in Level-1 Cachesen_US
dc.typeConference Objecten_US
dc.departmentFaculties, Faculty of Engineering, Department of Computer Engineeringen_US
dc.departmentFakülteler, Mühendislik Fakültesi, Bilgisayar Mühendisliği Bölümütr_TR
dc.identifier.startpage1
dc.identifier.endpage6
dc.relation.tubitakinfo:eu-repo/grantAgreement/TÜBİTAK/EEEAG/112E004en_US
dc.relation.ecinfo:eu-repo/grantAgreement/EC/FP7/318693en_US
dc.authorid0000-0003-2701-3787-
dc.identifier.wosWOS:000345738500001en_US
dc.identifier.scopus2-s2.0-84906688076en_US
dc.institutionauthorErgin, Oğuz-
dc.identifier.doi10.1109/IOLTS.2014.6873660-
dc.authorwosidE-5717-2010-
dc.authorscopusid6603141208-
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.identifier.scopusquality--
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.languageiso639-1en-
item.cerifentitytypePublications-
item.openairetypeConference Object-
item.grantfulltextnone-
crisitem.author.dept02.3. Department of Computer Engineering-
Appears in Collections:Bilgisayar Mühendisliği Bölümü / Department of Computer Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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