Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/6257
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dc.contributor.authorÇelik, M. Eren-
dc.contributor.authorBozbey, A.-
dc.date.accessioned2021-09-11T15:35:30Z-
dc.date.available2021-09-11T15:35:30Z-
dc.date.issued2013en_US
dc.identifier.issn1557-1939-
dc.identifier.urihttps://doi.org/10.1007/s10948-012-1837-1-
dc.identifier.urihttps://hdl.handle.net/20.500.11851/6257-
dc.description.abstractRapid Single Flux Quantum (RSFQ) computing is a developing technology that enables high speed computing such as microprocessors, network routers and analog to digital converters. However, as the complexity and the computing speed of these circuits increase, timing errors of individual gates become more relevant. Most of these timing errors occur on the signal distribution path due to the use of a large number of wiring cells but these effects are mostly ignored. Hence future circuit optimization tools should take both delay and jitter amount into account. Therefore, delay and jitter values of single and cascaded fundamental RSFQ wiring cells, namely Josephson transmission lines (JTL), splitters, and mergers, are analyzed. Also, low bias voltage driving of the circuit and the dependence on input signal frequency effects are observed. In conclusion, jitter and delay values depending on the aforementioned parameters for single gates and cascaded gates are reported.en_US
dc.description.sponsorshipTUBITAKTurkiye Bilimsel ve Teknolojik Arastirma Kurumu (TUBITAK) [111E191]en_US
dc.description.sponsorshipThe authors would like to thank Dr. Melda Yuksel for discussion about distribution functions. This work is supported by TUBITAK with project number "111E191".en_US
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.relation.ispartofJournal of Superconductivity And Novel Magnetismen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectJitteren_US
dc.subjectRSFQen_US
dc.subjectStatisticalen_US
dc.subjectTimingen_US
dc.titleAnalysis of Delay and Jitter of Rapid Single Flux Quantum Wiring Cellsen_US
dc.typeArticleen_US
dc.departmentFaculties, Faculty of Engineering, Department of Electrical and Electronics Engineeringen_US
dc.departmentFakülteler, Mühendislik Fakültesi, Elektrik ve Elektronik Mühendisliği Bölümütr_TR
dc.identifier.volume26en_US
dc.identifier.issue5en_US
dc.identifier.startpage1811en_US
dc.identifier.endpage1819en_US
dc.authorid0000-0003-2747-310X-
dc.authorid0000-0002-6010-4245-
dc.identifier.wosWOS:000323906600075en_US
dc.identifier.scopus2-s2.0-84959219152en_US
dc.institutionauthorBozbey, Ali-
dc.identifier.doi10.1007/s10948-012-1837-1-
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.scopusqualityQ3-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
item.fulltextNo Fulltext-
item.openairetypeArticle-
item.cerifentitytypePublications-
item.languageiso639-1en-
crisitem.author.dept02.5. Department of Electrical and Electronics Engineering-
Appears in Collections:Elektrik ve Elektronik Mühendisliği Bölümü / Department of Electrical & Electronics Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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