Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/7342
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dc.contributor.authorMahariq, İbrahim-
dc.contributor.authorKurt, Hamza-
dc.contributor.authorKuzuoğlu, M.-
dc.date.accessioned2021-09-11T15:56:31Z-
dc.date.available2021-09-11T15:56:31Z-
dc.date.issued2015en_US
dc.identifier.issn1054-4887-
dc.identifier.issn1943-5711-
dc.identifier.urihttps://hdl.handle.net/20.500.11851/7342-
dc.description.abstractIn this paper, a comparison amongst the spectral element method (SEM), the finite difference method (FDM), and the first-order finite element method (FEM) is presented. For the sake of consistency, the comparison is carried out on one-dimensional and two-dimensional boundary value problems based on the same measure of error in order to emphasize on the high accuracy gained by the SEM. Then, the deterioration in the accuracy of the SEM due to the elemental deformation is demonstrated. Following this, we try to answer the question: Do we need the high accuracy offered by the SEM in computational electromagnetics? The answer is supported by solving a typical, unbounded electromagnetic scattering problem in the frequency domain by the SEM. Domain truncation is performed by the well-known perfectly matched layer (PML).en_US
dc.description.sponsorshipTechnical Research Council of Turkey (TUBITAK)Turkiye Bilimsel ve Teknolojik Arastirma Kurumu (TUBITAK); Turkish Academy of SciencesTurkish Academy of Sciencesen_US
dc.description.sponsorshipThe first author acknowledges the financial support from Technical Research Council of Turkey (TUBITAK). Kurt acknowledges partial support from the Turkish Academy of Sciences.en_US
dc.language.isoenen_US
dc.publisherApplied Computational Electromagnetics Socen_US
dc.relation.ispartofApplied Computational Electromagnetics Society Journalen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectDeformationen_US
dc.subjectelectromagnetic scatteringen_US
dc.subjectfinite differenceen_US
dc.subjectfinite elementen_US
dc.subjectphotonic nanojeten_US
dc.subjectspectral element methoden_US
dc.titleQuestioning Degree of Accuracy Offered by the Spectral Element Method in Computational Electromagneticsen_US
dc.typeArticleen_US
dc.departmentFaculties, Faculty of Engineering, Department of Electrical and Electronics Engineeringen_US
dc.departmentFakülteler, Mühendislik Fakültesi, Elektrik ve Elektronik Mühendisliği Bölümütr_TR
dc.identifier.volume30en_US
dc.identifier.issue7en_US
dc.identifier.startpage698en_US
dc.identifier.endpage705en_US
dc.authorid0000-0002-3599-0644-
dc.authorid0000-0002-7222-3014-
dc.identifier.wosWOS:000357767100001en_US
dc.identifier.scopus2-s2.0-84940759298en_US
dc.institutionauthorKurt, Hamza-
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.scopusqualityQ3-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
item.fulltextNo Fulltext-
item.openairetypeArticle-
item.cerifentitytypePublications-
item.languageiso639-1en-
crisitem.author.dept02.5. Department of Electrical and Electronics Engineering-
Appears in Collections:Elektrik ve Elektronik Mühendisliği Bölümü / Department of Electrical & Electronics Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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