Duran, Hatice2025-04-012025-04-012024https://drive.google.com/file/d/1A0nwW6MJ16D6EUuauWSkYJXopR1u0Qt0/view?usp=drive_linkhttps://hdl.handle.net/20.500.11851/122374rd International Symposium on Characterization (ISC’24) 16-18 October 2024, Sakarya, TürkiyeXPS, or X-ray Photoelectron Spectroscopy, is a technique used to analyze the chemical composition, chemical state, and electronic state of elements present in a material with high sensitivity to the surface. It measures elemental composition at the parts-per-thousand range and is able to provide information about the oxidation state of materials. In an upcoming lecture, I will cover the working principles, advantages, limitations, and application areas of this widely-used method in the analysis of surface chemical structure. I will also present examples of chemical analysis on different surfaces, such as metal, metal oxide, and polymer, to provide a better understanding of the subject.eninfo:eu-repo/semantics/openAccessXPSthin filmcharacterizationConference Object