Reliability and Availability Analysis for Electronic Circuit Design

Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/11003

Title:	Reliability and Availability Analysis for Electronic Circuit Design
Authors:	Sevimçok, S. Girici, T.
Keywords:	Availability; electronic design; FTA; MTBF; reliability DC-DC converters; Electric network analysis; Integrated circuit manufacture; Reliability analysis; Timing circuits; Availability analysis; Electronic circuit design; Electronic design; Electronics circuits; Failure tree analyze; Failure trees; Mean time between failures; Reliability and availability; Mean time between failures
Publisher:	Institute of Electrical and Electronics Engineers Inc.
Abstract:	This paper provides a reliability, availability and Mean Time Between Failure (MTBF) analysis for a sample DC/DC converter and Discrete I/O electronic circuit stages. These analyses were performed using the Failure Tree Analyses (FTA) approach. The reason for choosing these structures is that they are frequently used in today's electronic design. In this study, the effect of the importance of reliability on the whole system, starting from a component in electronic circuit design, has been demonstrated. © 2023 IEEE.
Description:	Marmara University 10th International Conference on Electrical and Electronics Engineering, ICEEE 2023 -- 8 May 2023 through 10 May 2023 -- 194296
URI:	https://doi.org/10.1109/ICEEE59925.2023.00072 https://hdl.handle.net/20.500.11851/11003
ISBN:	9798350304299
Appears in Collections:	Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection

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