Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/1320
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dc.contributor.authorBozbey, Ali-
dc.contributor.authorKita, Yuma-
dc.contributor.authorKamiya, Kyohei-
dc.contributor.authorKozaka, Misaki-
dc.contributor.authorTanaka, Masamitsu-
dc.contributor.authorIshida, Takekazu-
dc.contributor.authorFujimaki, Akira-
dc.date.accessioned2019-06-26T07:43:35Z
dc.date.available2019-06-26T07:43:35Z
dc.date.issued2016
dc.identifier.citationBozbey, A., Kita, Y., Kamiya, K., Kozaka, M., Tanaka, M., Ishida, T., & Fujimaki, A. (2016). Development of an Advanced Circuit Model for Superconducting Strip Line Detector Arrays. IEICE Transactions on Electronics, 99(6), 676-682.en_US
dc.identifier.issn1745-1353
dc.identifier.urihttps://www.jstage.jst.go.jp/article/transele/E99.C/6/E99.C_676/_article-
dc.identifier.urihttps://hdl.handle.net/20.500.11851/1320-
dc.description.abstractOne of the fundamental problems in many-pixel detectors implemented in cryogenics environments is the number of bias and read-out wires. If one targets a megapixel range detector, number of wires should be significantly reduced. One possibility is that the detectors are serially connected and biased by using only one line and read-out is accomplished by on-chip circuitry. In addition to the number of pixels, the detectors should have fast response times, low dead times, high sensitivities, low inter-pixel crosstalk and ability to respond to simultaneous irradiations to individual pixels for practical purposes. We have developed an equivalent circuit model for a serially connected superconducting strip line detector (SSLD) array together with the read-out electronics. In the model we take into account the capacitive effects due to the ground plane under the detector, effects of the shunt resistors fabricated under the SSLD layer, low pass filters placed between the individual pixels that enable individual operation of each pixel and series resistors that prevents the DC bias current flowing to the read-out electronics as well as adjust the time constants of the inductive SSLD loop. We explain the results of investigation of the following parameters: Crosstalk between the neighbor pixels, response to simultaneous irradiation, dead times, L/R time constants, low pass filters, and integration with the SFQ front-end circuit. Based on the simulation results, we show that SSLDs are promising devices for detecting a wide range of incident radiation such as neurons, X-rays and THz waves in many-pixel configurations.en_US
dc.description.sponsorshipThis work is partially supported by TUBITAK with the project number 114E099 and JSPS KAKENHI with the grant number 23226019.en_US
dc.language.isoenen_US
dc.publisherIEICE-Inst Electronics Information Communications Engen_US
dc.relation.ispartofIEICE Transactions On Electronicsen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectSSLDen_US
dc.subjectkinetic inductance detectorsen_US
dc.subjectSFQen_US
dc.subjectsuperconductorsen_US
dc.subjectneutron detectoren_US
dc.titleDevelopment of an Advanced Circuit Model for Superconducting Strip Line Detector Arraysen_US
dc.typeArticleen_US
dc.departmentFaculties, Faculty of Engineering, Department of Electrical and Electronics Engineeringen_US
dc.departmentFakülteler, Mühendislik Fakültesi, Elektrik ve Elektronik Mühendisliği Bölümütr_TR
dc.identifier.volumeE99C
dc.identifier.issue6
dc.identifier.startpage676
dc.identifier.endpage682
dc.relation.tubitakTUBITAK [114E099]en_US
dc.authorid0000-0003-2747-310X-
dc.identifier.wosWOS:000381558400013en_US
dc.identifier.scopus2-s2.0-85010034604en_US
dc.institutionauthorBozbey, Ali-
dc.identifier.doi10.1587/transele.E99.C.676-
dc.authorwosidE-2738-2010-
dc.authorscopusid13606998800-
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.relation.otherJSPS KAKENHI [23226019]en_US
item.fulltextWith Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.languageiso639-1en-
item.cerifentitytypePublications-
item.openairetypeArticle-
item.grantfulltextopen-
crisitem.author.dept02.5. Department of Electrical and Electronics Engineering-
Appears in Collections:Elektrik ve Elektronik Mühendisliği Bölümü / Department of Electrical & Electronics Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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