Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/518
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dc.contributor.authorDemirci Sankır, Nurdan-
dc.contributor.authorAydın, Erkan-
dc.contributor.authorSankır, Mehmet-
dc.date.accessioned2016-11-07 17:26:29
dc.date.available2019-02-21T13:11:17Z
dc.date.issued2014-04-14
dc.identifier.citationSankir, N. D., & Erkan Aydin, M. S. (2014). Impedance spectroscopy and dielectric properties of silver incorporated indium sulfide thin films. International Journal of Electrochemical Science, 9(7), 3864-3875.en_US
dc.identifier.urihttps://hdl.handle.net/20.500.11851/518-
dc.description.abstractIn this study, silver incorporated indium sulfide (In2S3) thin films have been deposited on soda lime glass via spray pyrolysis technique. Structural and electrical properties have been tailored by adding controlled amount of silver acetate into the precursor solution. A phase shift form cubic -In2S3 to AgInS2 has been evidenced from X-ray diffraction spectra (XRD). Molecularity of the samples, meaning (Ag+In)/S ratio, has directly affected the electrical conductivity as well as the dielectric properties. Direct and alternating current conductivities increased with increasing the (Ag+In)/S ratio upto 10% silver incorporation. When the silver amount further increased conductivity decreased due to the pronounced secondary phase formation. The complex impedance analysis was used to determine the effect of silver on the conduction mechanism. It has been observed that frequency exponent of all samples were greater than unity indicating the nanocrystalline nature of the films. The variation of dielectric properties and ac conductivity with frequency revealed that the relaxation process in silver incorporated In2S3 thin films was due to the Maxwell–Wagner type of interfacial polarization in general.en_US
dc.language.isoenen_US
dc.relation.ispartofInternational journal of electrochemical scienceen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.source90703864.pdfen_US
dc.subjectSpray pyrolysisen_US
dc.subjectindium sulfideen_US
dc.subjectsilver incorporationen_US
dc.subjectimpedance spectroscopyen_US
dc.subjectdielectric propertiesen_US
dc.titleImpedance Spectroscopy and Dielectric Properties of Silver Incorporated Indium Sulfide Thin Filmsen_US
dc.typeArticleen_US
dc.departmentFaculties, Faculty of Engineering, Department of Material Science and Nanotechnology Engineeringen_US
dc.departmentFakülteler, Mühendislik Fakültesi, Malzeme Bilimi ve Nanoteknoloji Mühendisliği Bölümütr_TR
dc.identifier.volume9
dc.identifier.startpage3864
dc.identifier.endpage3875
dc.authorid0000-0002-7004-1217-
dc.authorid0000-0003-2103-0439-
dc.identifier.wosWOS:000336899000044en_US
dc.identifier.scopus2-s2.0-84898616560en_US
dc.institutionauthorSankır, Mehmet-
dc.institutionauthorDemirci Sankır, Nurdan-
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
item.fulltextWith Fulltext-
item.languageiso639-1en-
item.openairetypeArticle-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
item.grantfulltextopen-
crisitem.author.dept02.6. Department of Material Science and Nanotechnology Engineering-
crisitem.author.dept02.6. Department of Material Science and Nanotechnology Engineering-
Appears in Collections:Malzeme Bilimi ve Nanoteknoloji Mühendisliği Bölümü / Department of Material Science & Nanotechnology Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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