Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/8374
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dc.contributor.authorYıldız, M.K.-
dc.contributor.authorUyar, F.-
dc.contributor.authorKartaloğlu, T.-
dc.contributor.authorÖzdür, I.-
dc.contributor.authorÖzbay, E.-
dc.date.accessioned2022-01-15T13:02:41Z-
dc.date.available2022-01-15T13:02:41Z-
dc.date.issued2021-
dc.identifier.isbn9781557528209-
dc.identifier.urihttps://hdl.handle.net/20.500.11851/8374-
dc.descriptionOptical Sensors, Sensors 2021 - Part of OSA Optical Sensors and Sensing Congress 2021 -- 19 July 2021 through 23 July 2021 -- 174326en_US
dc.description.abstractThe dual-pulse interrogation enables the phase extraction from the intensity of the back-reflection signal in ?-OTDR systems. We investigate the high and low fidelity regions in the back-reflected signal by analyzing the system response to external disturbances. © OSA 2021.en_US
dc.language.isoenen_US
dc.publisherThe Optical Societyen_US
dc.relation.ispartofOptics InfoBase Conference Papersen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectBack reflectionen_US
dc.subjectDual-pulsesen_US
dc.subjectExternal disturbancesen_US
dc.subjectHigh-fidelityen_US
dc.subjectLow fidelitiesen_US
dc.subjectPhase extractionen_US
dc.subjectReflected signalen_US
dc.subjectSystem responseen_US
dc.titleAn investigation of fidelity regions in the dual-pulse ?OTDR systemsen_US
dc.typeConference Objecten_US
dc.departmentFaculties, Faculty of Engineering, Department of Electrical and Electronics Engineeringen_US
dc.departmentFakülteler, Mühendislik Fakültesi, Elektrik ve Elektronik Mühendisliği Bölümütr_TR
dc.identifier.scopus2-s2.0-85120444802en_US
dc.institutionauthorÖzdür, İbrahim Tuna-
dc.authorscopusid57360893600-
dc.authorscopusid57203136393-
dc.authorscopusid6701467908-
dc.authorscopusid16029503000-
dc.authorscopusid7005956635-
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.languageiso639-1en-
item.cerifentitytypePublications-
item.openairetypeConference Object-
item.grantfulltextnone-
Appears in Collections:Elektrik ve Elektronik Mühendisliği Bölümü / Department of Electrical & Electronics Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
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