Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/1331
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dc.contributor.authorDemirci Sankır, Nurdan-
dc.contributor.authorAydın, Erkan-
dc.contributor.authorSankır, Mehmet-
dc.contributor.authorBozbey, Ali-
dc.date.accessioned2019-06-26T07:43:36Z
dc.date.available2019-06-26T07:43:36Z
dc.date.issued2014-06
dc.identifier.citationSankir, N. D., Aydin, E., Sankir, M., & Bozbey, A. (2014). Influence of excitation frequency on structural and electrical properties of spray pyrolyzed CuInS2 thin films. Journal of Materials Processing Technology, 214(9), 1879-1885.en_US
dc.identifier.issn0924-0136
dc.identifier.urihttps://linkinghub.elsevier.com/retrieve/pii/S0924013614001307-
dc.identifier.urihttps://hdl.handle.net/20.500.11851/1331-
dc.description.abstractThis paper reports the cost effective deposition of the copper indium sulfide (CuInS2) thin films under atmospheric conditions via ultrasonic spray pyrolysis. Structural and electrical properties of these films have been tailored by controlling the nozzle excitation frequency and the solution loading. Smoother films have been obtained via 120 kHz excitation frequency compare to the 48 kHz. Band gap energy of the films has also been tailored via excitation frequency. UV-vis-NIR analysis revealed that films deposited at 48 kHz excitation frequency had lower band gap energies. Although, both excitation frequencies resulted chalcopyrite structure, crystallinity of the CuInS2 films was better for 120 kHz. On the other hand, better optical absorption in visible and near infrared region was observed at 48 kHz. Moreover, room temperature electrical conductivity of the samples deposited at 48 kHz excitation frequency was higher than that of samples deposited at 120 kHz. Temperature dependent electrical conductivity data showed that variable range hopping mechanism can be used to explain the conduction of spray pyrolyzed CuInS2 thin films. Electrical mobility as high as 48 cm(2)/Vs has been observed for the sample deposited from 0.51 ml/cm(2) loading at 48 kHz excitation frequency. This value is very close to the mobility of vacuum deposited thin films like amorphous silicon, which is one of the most commonly used semiconductor in electronic and energy applications. (C) 2014 Elsevier B.V. All rights reserved,en_US
dc.description.sponsorshipThis study was supported by Republic of Turkey Ministry of Science, Industry and Technology under the research Grant 01072.STZ.2011-2.en_US
dc.language.isoenen_US
dc.publisherElsevier Science Saen_US
dc.relation.ispartofJournal Of Materials Processing Technologyen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectCopper indium sulfideen_US
dc.subjectUltrasonic spray pyrolysisen_US
dc.subjectChalcopyrite filmen_US
dc.subjectSolar cellsen_US
dc.subjectNozzle frequencyen_US
dc.titleInfluence of excitation frequency on structural and electrical properties of spray pyrolyzed CuInS2 thin filmsen_US
dc.typeArticleen_US
dc.departmentFaculties, Faculty of Engineering, Department of Electrical and Electronics Engineeringen_US
dc.departmentFaculties, Faculty of Engineering, Department of Material Science and Nanotechnology Engineeringen_US
dc.departmentFakülteler, Mühendislik Fakültesi, Elektrik ve Elektronik Mühendisliği Bölümütr_TR
dc.departmentFakülteler, Mühendislik Fakültesi, Malzeme Bilimi ve Nanoteknoloji Mühendisliği Bölümütr_TR
dc.identifier.volume214
dc.identifier.issue9
dc.identifier.startpage1879
dc.identifier.endpage1885
dc.authorid0000-0003-2747-310X-
dc.identifier.wosWOS:000337856000012en_US
dc.identifier.scopus2-s2.0-84899654240en_US
dc.institutionauthorBozbey, Ali-
dc.institutionauthorSankır, Mehmet-
dc.institutionauthorDemirci Sankır, Nurdan-
dc.contributor.YOKid143697-
dc.identifier.doi10.1016/j.jmatprotec.2014.04.005-
dc.authorwosidE-2738-2010-
dc.authorscopusid13606998800-
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.scopusqualityQ1-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairetypeArticle-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.fulltextNo Fulltext-
item.languageiso639-1en-
crisitem.author.dept02.6. Department of Material Science and Nanotechnology Engineering-
crisitem.author.dept02.6. Department of Material Science and Nanotechnology Engineering-
crisitem.author.dept02.5. Department of Electrical and Electronics Engineering-
Appears in Collections:Elektrik ve Elektronik Mühendisliği Bölümü / Department of Electrical & Electronics Engineering
Malzeme Bilimi ve Nanoteknoloji Mühendisliği Bölümü / Department of Material Science & Nanotechnology Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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