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Title: Exploiting a Fast and Simple ECC for Scaling Supply Voltage in Level-1 Caches
Authors: Yalçın, Gülay
İşlek, Emrah
Tozu, Öykü
Reviriego, Pedro
Cristal, Adrian
Ünsal, Osman Sabri
Ergin, Oğuz
Keywords: Error correction
Radiation hardening
Correction codes
Issue Date: 2014
Publisher: IEEE
Source: Yalcin, G., Islek, E., Tozlu, O., Reviriego, P., Cristal, A., Unsal, O. S., & Ergin, O. (2014, July). Exploiting a fast and simple ECC for scaling supply voltage in level-1 caches. In 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) (pp. 1-6). IEEE.
Abstract: Scaling supply voltage to near-threshold is a very effective approach in reducing the energy consumption of computer systems. However, executing below the safe operation margin of supply voltage introduces high number of persistent failures, especially in memory structures. Thus, it is essential to provide reliability schemes to tolerate these persistent failures in the memory structures. In this study, we adopt a Single Error Correction Multiple Adjacent Error Correction (SEC-MAEC) code in order to minimize the energy consumption of L1 caches. In our evaluations, we present that the SEC-MAEC code is a fast and energy efficient Error Correcting Code (ECC). It presents 10X less area overhead and 2X less latency for the decoder compared to Orthogonal Latin Square Code, the state-of-the art ECC utilized in the L1 cache under the scaling supply voltage.
Description: IEEE 20th International On-Line Testing Symposium (IOLTS) (2014 : Catalunya, SPAIN)
ISBN: 978-1-4799-5324-0
ISSN: 1942-9398
Appears in Collections:Bilgisayar Mühendisliği Bölümü / Department of Computer Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

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