Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.11851/7342
Title: Questioning Degree of Accuracy Offered by the Spectral Element Method in Computational Electromagnetics
Authors: Mahariq, İbrahim
Kurt, Hamza
Kuzuoğlu, M.
Keywords: Deformation
electromagnetic scattering
finite difference
finite element
photonic nanojet
spectral element method
Issue Date: 2015
Publisher: Applied Computational Electromagnetics Soc
Abstract: In this paper, a comparison amongst the spectral element method (SEM), the finite difference method (FDM), and the first-order finite element method (FEM) is presented. For the sake of consistency, the comparison is carried out on one-dimensional and two-dimensional boundary value problems based on the same measure of error in order to emphasize on the high accuracy gained by the SEM. Then, the deterioration in the accuracy of the SEM due to the elemental deformation is demonstrated. Following this, we try to answer the question: Do we need the high accuracy offered by the SEM in computational electromagnetics? The answer is supported by solving a typical, unbounded electromagnetic scattering problem in the frequency domain by the SEM. Domain truncation is performed by the well-known perfectly matched layer (PML).
URI: https://hdl.handle.net/20.500.11851/7342
ISSN: 1054-4887
1943-5711
Appears in Collections:Elektrik ve Elektronik Mühendisliği Bölümü / Department of Electrical & Electronics Engineering
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

Show full item record

CORE Recommender

Page view(s)

26
checked on Dec 26, 2022

Google ScholarTM

Check


Items in GCRIS Repository are protected by copyright, with all rights reserved, unless otherwise indicated.